Presentation: A New Efficient Test Design Technique
Current test design techniques for stateful applications have several issues. We introduced a new technique by which higher-order bugs can be revealed. The technique is a step-by-step solution, where a model is gradually created. It is controlled by a given test selection criterion such as all-transition-pair testing. The method consists of two phases. During the first, a basic test selection criterion is covered so that the tester adds abstract test steps. During the second phase, the method offers the steps that are either accepted or rejected when infeasible.